A. Karakteristika:

1. Aŋuɛ̈ɛ̈r kënë alëu bï ya luɔ̈ɔ̈i bï ya tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ(I can measure (I can measure)

decid706.5nm、656.3nm、589.3nm、546.1nm、486.1nm、435.8nm、434.1nmku404.7nmRefraction rate of eight wavelengths commonly used (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used) (Refraction rate of eight wavelengths commonly used))Ye.

Na cï tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yen

2.Kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi në kë de kä ye kek looi

A kɔc cï tɛmɛ ka gël a kɔc cï tɛmɛ ka gël a kɔc cï tɛmɛ ka gël a kɔc cï tɛmɛ.

3.Lɔnadɛ̈ ke instrument kënë ee rot gɛɛi në lööŋ de refraction yic, refraction cï tɛmɛ ya tɛmɛ ya tɛmɛ ya tɛmɛ ya tɛmɛ ya tɛmɛ ya tɛmɛ ya tɛmɛ ya tɛmɛ. Kän looi në Optical Glass Factory

Kä yam ye them aye nafa ye.

2. Parameters teknikal:

1.Kuɛl: SolidnD 1.30~1.95LiquidnD 1.30~1.70

2.A tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ:5×10-5

3.Kuen de sistem de multiplication:25×

4.Kuen wɛ̈t:10′

5.Value of Micro Size:0.05′

6.Instrument Weight:11kg

7.Instrument Volume:376mm×230mm×440mm