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WDW Series Microcomputer Control High Low Temperature Electronic Universal Testing Machine (WDW Series Microcomputer Control High Low Temperature Electronic Universal Testing Machine)
WDW Series Microcomputer Control High Low Temperature Electronic Universal Testing Machine (WDW Series Microcomputer Control High Low Temperature Elec
Detalji proizvoda
WDW series microcomputer control high and low temperature electronic universal tester can be divided into WDW-G10 ~ 100, WDW-G200 ~ 300, WDW-G500 ~ 600, WDW-G1000 models of high temperature stretch tester, this machine sets the latest mechanical manufacturing technology, all digital AC servo motor and servo drive technology, all digital measurement amplification technology and computer control technology in one, with a beautiful appearance, easy to operate, performance stable and reliable, energy saving and environmental protection. A ye tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ Masin ye tɛmɛ ne tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ ye tɛmɛ A lëu bï kä wɛɛr looi, cït mɛn, metal, plastik, rubber, wala tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ.
II. Sistɛm ye looi:
The high and low temperature stretch testing machine's high and low temperature test box main role is to provide high and low temperature testing environment, can also be used for various electrical engineers, electronic equipment and other samples of environment screening, the box inside and outside are made with stainless steel plates, front door open, with observation windows, the box has a lighting.
Third, luɔɔi kɛnɛya:
1, tɛmɛ: 15 ℃ ~ 35 ℃
2, RH: ≤85%
3, tɛmɛ: 86 ~ 106 (Kpa)
4, ka tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n.
5.No sunlight direct or other heat sources direct radiation. No sunlight direct or other heat sources direct radiation. No sunlight direct or other heat sources direct radiation. No sunlight direct or other heat sources direct radiation. No sunlight direct or other heat sources direct radiation.
6, tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n
7.No strong electromagnetic field influence around.
8, tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n
9, ago tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë
WDW series microcomputer control high and low temperature electronic universal testing machine technical parameters: WDW series microcomputer control high and low temperature electronic universal testing machine technical parameters: WDW series microcomputer control high and low temperature electronic universal testing machine technical parameters: WDW series microcomputer control high and low temperature electronic universal testing machine technical parameters:
4. Ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ:
1、GB10586-89 Low temperature test box technical conditions
GB2423.1-89 Electrical Electronics Basic Environmental Test Procedure Test A: Low Temperature Test Method
3、GB2423.2-89 Electrical Electronics Products Basic Environmental Test Procedure Test B: High Temperature Test Method
4、GJB150.3-86 Military Equipment Environmental Testing Method
| Model Testing | WDW-G10～100 | WDW-G200～300 | WDW-G500～600 | WDW-G1000 | |
| 1 | Max test force | 10KN～100KN | 200KN；300KN | 500KN；600KN | 1000KN |
| 2 | Resolution Power Testing | 1/±300000F.S (Resolution ye rot looi) | |||
| 3 | Wɛ̈ɛ̈r wɛ̈ɛ̈r wɛ̈ɛ̈r wɛ̈ɛ̈r wɛ̈ɛ̈r | ±1% në 1%-100% range | |||
| 4 | Speed of moving beam | 0.005---500mm/min | |||
| 5 | Distance ye rot looi | 1000mm | 1250mm | 1250mm | 1250mm |
| 6 | Tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr tɛstɛr | 500mm | 600 | 600 | 600 |
| 7 | Kontrol | Mikro-computer Automatic Control | |||
| High temperature furnace system (Sistɛm kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye) |
Sistɛm kënë ee tɔ̈u në tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ Temperature controller ye PID blur control method, test temperature too low, control precision is high. Temperature controller ye PID blur control method, test temperature too low, control precision is high. Temperature controller ye PID blur control method, test temperature too low, control precision is high. A bɛ se ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ Ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ |
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| Temperature control range | Room temperature -50 ℃ ~ 1200 ℃ wala looi në kë wïc | ||||
| Longitude de zone chaude | 100㎜ | ||||
| Temperature deviation | 200～600℃； ±2℃ 600～900℃； ±3℃ 900～1200℃； ±4℃ |
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| Kuen kony | 2KW | ||||
| Waktu kɔrɔ | 1200°C, ≈2H | ||||
| Temperature display | 0.1℃ | ||||
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