Scanning Electrochemical Microsystems (SECM) ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r

AC Scanning Electrochemical Microscope System (ac-SECM) (AC-SECM) (AC-SECM) (AC-SECM) (AC-SECM) (AC-SECM) (AC-SECM) (AC-SECM

Sistɛm elektrokemikal mikroskop ye cɔl intermittent contact scanning (ic-SECM)

Microzone Electrochemical Impedance Testing System (LEIS) ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r

Scanning Vibration Click Testing System (SVET) ye cɔl

Elektrolyt Microdrop Scanning System (SDS)

AC Electrolyte Microdrop Scanning System (ac-SDS) (AC-SDS) (AC-SDS) (AC-SDS) (AC-SDS) (AC-SDS) (AC-SDS) (AC-SDS) (AC-SDS)

Scanning Kelvin Probe Testing System (SKP) ye looi

Sistɛm de Micro-Zone Morphology Testing (OSP)

Kuen path

Sisitɛm de tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈ Ka tɛmɛ Uniscan's unique hybrid 32-bit DAC technology, kɔc ye luui alëu bïk tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ

Platform de luɔi ye kɔrɔ ku ye kɔrɔ

Sɛtɛm kënë bɛ̈n ya gäm teknoloji 9 ye cɔl probe technology, man ye M470 looi bɛ̈n ya luɔɔi ye cɔl electrochemical scanning beach town.

Aksesɛr juëc

7 modules ye sɔrɔ, 3 battery pools, probes, long distance microscopes, kuru software de data analysis ye sɔrɔ.

M470 awowa yam

SECM Automatic Processing Curves

SECM user custom processing curve step changes

Kuen ye High Resolution

Ajuiɛɛr de phase në man wala në rot

M470 bɛ̈n naŋ kä tɔŋ:

Tilt correction

X wala Y curve phase reduction (5th order polynomial)

2D wala 3D Quick Fourier Change

Automatic sorting of experiments, probe movements and regional drawings (Kɔɔr tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n)

Graphic Experimental Sequencing Engine (GESE) (Gɛɛr ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r

Support multi-zone scanning

Data view juëc ye kɛ experiment

Analisis Pike

M470 yaa 4th generation scanning probe system ye Uniscan Instruments looi, ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye.

Parameters teknis M470

Tasiɛɛr (teknoloji)

Scanning range (x, y, z) ka dït ka 100mm

Resolution de drive de scan 0.1nm

Closed loop positioning linear zero delay encoder, direct real-time reading of x, z and y displacements

Resolution axis (x, y, z) 20nm

Lɛɛr ye cɔl scanning 12.5mm/s

Resolution de measurement 32-bit decoder @ up to 40MHz

Piezoelectric (IC-ku AC-scan probe technology)

Vibration range 20nm ~ 2μm peak and peak 1nm increment between 20nm ~ 2μm peak and peak 1nm increment between 20nm ~ 2μm peak and peak

Minimal vibration resolution 0.12nm ((16-bit DAC, 4μm)

Pneumatic Crystal Extension 100μm (Pneumatic Crystal Extension) 100μm (Pneumatic Crystal Extension) 100μm (Pneumatic Crystal Extension)

Tɛ̈n yenë yen tɔ̈u thïn 0.09nm ((20-bit DAC, 100μm)

Elektrik

Scan front end 500×420×675mm ((H×W×D)

Scan Control Unit275450×400mm ((H×W×D)

Puwol250W