Roundabout Science Instruments (Shanghai) Co., Ltd.
Kuæa>Proizvodi>Leica EM RES101 Ion Beam Grinder ye luui n? ??n ju?c yiic
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    Room 1013, No. 20, Lane 26, Hexin Road, Jiading District, Shanghai (Office Building No. 5, Jiangqiao Wanda Square)
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Leica EM RES101 Ion Beam Grinder ye luui n? ??n ju?c yiic
Leica EM RES101 Ion Beam Grinder ye luui n? ??n ju?c yiic
Detalji proizvoda

Leica EM RES101

Leica EM RES101 ee rot ye c?l ion beam grinding system ye c?l computer ye c?l ion beam grinding system ye c?l ion beam grinding system ye c?l ion beam grinding system ye c?l ion beam grinding system ye c?l ion beam grinding system ye c?l ion beam grinding system ye c?l ion beam grinding system
Leica EM RES101 ye ion grinding looi, a l?u b? ya waar 0°-90°; Ion source energy can be changed, and can be made high energy or low energy ion beam grinding. Ion source energy can be changed, and can be made high energy or low energy ion beam grinding. Ion source energy can be changed, and can be made high energy or low energy ion beam grinding. A tara kamera CCD ye t????u, a b? se ka t?? t??n yen? a t????u th?n. Ku ka t??u ke ye k?c ye k?c ye k?c ye k?c ye k?c ye k?c ye k?c ye k?c ye k?c ye k?c ye k?c ye k?c ye k?c ye k?c ye k?c ye k?c ye
F??r

Sampel looi

A l?u b? ya looi b? ya looi b? ya looi b? ya looi b? ya looi b? ya looi b? ya looi b? ya looi b? ya looi b? ya looi b? ya looi b? ya looi b? ya looi b? ya looi b? ya looi

K?mpit?r LAN

N? LAN, k?c ye lu??i al?u b?k k? ye kek looi ya c?k loi rot ku b?k k? ye kek looi ya t??, ku b?k k?c ye lu??i ya c?k loi rot ku b?k ya c?k loi rot.

Sisit?m friji nitrogen likid

LN2 cooling system optional, using Cu texture specimen table dedicated, ensuring the sample is truly cooled, so that no illusion occurs when sampling for heat sensitive samples, suitable for TEM and SEM sampling processing, making more flexible and variable methods for different types of sampling processing. LN2 cooling system optional, using Cu texture specimen table dedicated, ensuring the sample is truly cooled, so that no illusion occurs when sampling for heat sensitive samples, suitable for TEM and SEM sampling processing, making more flexible and variable methods for different types of sampling processing.

Automatic multi-function ion beam grinding system, a l?u b? ion thinning looi (n? TEM); Ion beam polishing, ion etching, sample ion cleaning and slope cutting (for SEM) etc. Ion beam polishing, ion etching, sample ion cleaning and slope cutting (for SEM) etc.

Ion beam energy 1keV 10keV, 2 ion guns can be tilted ±45°, sample table tilt angle -120° to 210°, ion beam processing angle 0° to 90°, sample plane swing angle <360°, vertical swing distance ±5mm

A l?u b??n ya t????u n? d?t: 25mm diameter, 12mm height

Sample Table: TEM Sample Table (?3.0mm wala ?2.3mm), FIB Sample Cleaning Table, SEM Sample Table, Slope Cutting Sample Table (35° wala 90° Slope Cutting for Samples) ku j?l ya Frozen Sample Table

Fully oil free vacuum system, sampling room with pre-pumping room, guaranteeing sample exchange time <1 minute

Full computer control, touch screen operation interface, built-in video watching system, can see real time sample out process

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Uspješna operacija!

Uspješna operacija!

Uspješna operacija!